KSD

Goodness-of-Fit Tests using Kernelized Stein Discrepancy

CRAN Package

An adaptation of Kernelized Stein Discrepancy, this package provides a goodness-of-fit test of whether a given i.i.d. sample is drawn from a given distribution. It works for any distribution once its score function (the derivative of log-density) can be provided. This method is based on "A Kernelized Stein Discrepancy for Goodness-of-fit Tests and Model Evaluation" by Liu, Lee, and Jordan, available at doi:10.48550/arXiv.1602.03253.

  • Version1.0.1
  • R versionunknown
  • LicenseMIT
  • Needs compilation?No
  • Last release01/11/2021

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  • Imports1 package
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