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Spatial Point Patterns Analysis
Perform first- and second-order multi-scale analyses derived from Ripley K-function (Ripley B. D. (1977)), for univariate, multivariate and marked mapped data in rectangular, circular or irregular shaped sampling windows, with tests of statistical significance based on Monte Carlo simulations.
- Version1.5-10
- R version≥ 3.5.0
- LicenseGPL-2
- Needs compilation?Yes
- Languageen-GB
- Last release12/11/2023
Documentation
Team
- Dominique Lamonica
- Raphael PelissierShow author detailsRolesAuthor
- Francois GoreaudShow author detailsRolesAuthor
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Dependencies
- Imports2 packages